# Electronics & Telecommunication Engineering Semester 3 Syllabus 2018

**Electronics & Telecommunication Engineering Semester 3 Syllabus 2018** – The Semester 3 syllabus for Mumbai University course credits of 2018 for Electronics and Telecommunication Engineering has common mathematics with other branches.Other important subjects of this branch are Circuit and transmission lines,analog and digital electronic circuits and electrical measurements which is also an electrical engineering subject.

**Electronics & Telecommunication Engineering Semester 3 Syllabus 2018 Marks**

**Electronics & Telecommunication Engineering Semester 3 Syllabus 2018 Credits**

Applied Mathematics III |

Laplace Transform 12 1.1 Laplace Transform (LT) of Standard Functions: Definition. unilateral and bilateral Laplace Transform, LT of sin(at), cos(at), at n e ,t , sinh(at), cosh(at), erf(t), Heavi-side unit step, dirac-delta function, LT of periodic function 1.2 Properties of Laplace Transform: Linearity, first shifting theorem, second shifting theorem, multiplication by n t , division by t , Laplace Transform of derivatives and integrals, change of scale, convolution theorem, initial and final value theorem, Parsavel’s identity 1.3 Inverse Laplace Transform: Partial fraction method, long division method, residue method 1.4 Applications of Laplace Transform: Solution of ordinary differential equations 2.0 Fourier Series 10 2.1 Introduction: Definition, Dirichlet’s conditions, Euler’s formulae 2.2 Fourier Series of Functions: Exponential, trigonometric functions, even and odd functions, half range sine and cosine series 2.3 Complex form of Fourier series, orthogonal and orthonormal set of functions, Fourier integral representation 3.0 Bessel Functions 08 3.1 Solution of Bessel Differential Equation: Series method, recurrence relation, properties of Bessel function of order +1/2 and -1/2 3.2 Generating function, orthogonality property 3.3 Bessel Fourier series of functions 4.0 Vector Algebra 12 4.1 Scalar and Vector Product: Scalar and vector product of three and four vectors and their properties 4.2 Vector Differentiation: Gradient of scalar point function, divergence and curl of vector point function 4.3 Properties: Solenoidal and irrotational vector fields, conservative vector field 4.4 Vector Integral: Line integral, Green’s theorem in a plane, Gauss’ divergence theorem, Stokes’ theorem 5.0 Complex Variable 10 5.1 Analytic Function: Necessary and sufficient conditions, Cauchy Reiman equation in polar form 5.2 Harmonic function, orthogonal trajectories 5.3 Mapping: Conformal mapping, bilinear transformations, cross ratio, fixed points, bilinear transformation of straight lines and circles |

Text books: 1. P. N. Wartikar and J. N. Wartikar, “A Text Book of Applied Mathematic”, Vol. I & II, Vidyarthi Griha Prakashan 2. A. Datta, “Mathematical Methods in Science and Engineering”, 2012 3. B.S. Grewal, “Higher Engineering Mathematics”, Khanna Publication Reference Books: 1. B. S. Tyagi, “Functions of a Complex Variable,” Kedarnath Ram Nath Publication 2. B. V. Ramana, “Higher Engineering Mathematics”, Tata Mc-Graw Hill Publication 3. Wylie and Barret, “Advanced Engineering Mathematics”, Tata Mc-Graw Hill 6th Edition 4. Erwin Kreysizg, “Advanced Engineering Mathematics”, John Wiley & Sons, Inc 5. Murry R. Spieget, “Vector Analysis”, Schaum’s outline series, Mc-Graw Hill Publication Internal Assessment (IA): Two tests must be conducted which should cover at least 80% of syllabus. The average marks of both the tests will be considered for final Internal Assessment. End Semester Examination: 1. Question paper will comprise of 6 questions, each carrying 20 marks. 2. The students need to solve total 4 questions. 3. Question No.1 will be compulsory and based on entire syllabus. 4. Remaining question (Q.2 to Q.6) will be selected from all the modules. Term Work/ Tutorial: At least 08 assignments covering entire syllabus must be given during the ‘class wise tutorial’. The assignments should be students’ centric and an attempt should be made to make assignments more meaningful, interesting and innovative. Term work assessment must be based on the overall performance of the student with every assignment graded from time to time. The grades will be converted to marks as per ‘credit and grading system’ manual and should be added and averaged. Based on above scheme grading and term work assessment should be done. |

Analog Electronics I – Electronics & Telecommunication Engineering Semester 3 Syllabus |

Diodes and their Applications 08 1.1 PN Junction Diode: Diode current equation, effect of temperature on diode characteristics, breakdown mechanism, diode as a switch, small signal model 1.2 Clippers and Clampers: Voltage transfer characteristics, series and shunt clippers, single diode series and shunt clamper circuits 1.3 Other PN junction devices: Construction and operation of Varactor diode, photodiode, Schottkey diode 2.0 Field Effect Transistors 08 2.1 Junction Field Effect Transistor (JFET): Construction, working, regions of operation, transfer (VGS, Vs, ID) and output (VDS, Vs, ID) characteristics, Schockely equation 2.2 Metal-Oxide Semiconductor Field Effect Transistor (MOSFET): E-MOSFET: MOS capacitor, energy band diagram of MOS capacitor in accumulation, depletion and inversion region, concept of threshold voltage, operation of MOSFET, derivation of threshold voltage and drain current, body effect, channel length modulation D-MOSFET: Construction and working 3.0 DC Analysis of Transistor Circuits 10 3.1 Bipolar Junction Transistor: Review of BJT characteristics, DC load line and regions of operation, transistor as a switch, DC analysis of common BJT circuits, analysis and design of fixed bias, collector to base bias and voltage divider bias, stability factor analysis 3.2 Junction Field Effect Transistor: Analysis and design of self bias and voltage divider bias 3.3 MOSFET: DC load line and region of operation, common MOSFETs configurations, analysis and design of biasing circuits 4.0 Small Signal Analysis of BJT Amplifiers 10 4.1 BJT CE Amplifier: Understanding of amplification concept with reference to input/output characteristics, AC load line analysis, definition of amplifier parameters Zi, Z0, Av and Ai, graphical analysis to evaluate parameters 4.2 Small Signal mid Frequency Models: Hybrid-pi model, early effect, h-parameter model 4.3 Small Signal Analysis: Small signal analysis (mid-frequency) (Zi, Z0, Av and Ai) of CE, CB, and CC configurations using hybrid-pi model, comparison between CE, CB, and CC configurations with reference to parameters 5.0 Small Signal Analysis of FET Amplifiers 08 5.1 JFET CS Amplifier: Small signal equivalent circuit and analysis (mid-frequency) (Zi, Z0 and Av) 5.2 E-MOSFET Amplifier: Graphical analysis to evaluate parameters, AC load line, small signal model, small signal (mid-frequency) analysis of CS, CD and CG amplifiers 6.0 Oscillators ( no numericals) 08 6.1 Concepts of Oscillator: Concept of negative and positive feedback and conditions for oscillation 6.2 RC oscillators: Phase shift and Wein bridge 6.3 LC Oscillators: Hartley, Colpitts and Clapps 6.4 Tuned Oscillator: Twin-T oscillator and crystal oscillator |

Text Books: 1. Donald A. Neamen, “Electronic Circuit Analysis and Design”, Tata McGraw Hill, 2nd Edition 2. Adel S. Sedra, Kenneth C. Smith, and Arun N Chandorkar, “Microelectronic Circuits Theory and Applications”, International Version, OXFORD International Students, Sixth Edition Recommended Books: 1. Sung-Mo Steve Kang, and Yusuf Leblebici, “CMOS Digital Integrated Circuits Analysis and Design”, TATA McGraw Hill, 2. S. Salivahanan, N. Suresh Kumar, “Electronic Devices and Circuits”, Tata Mc-Graw Hill, 3rd Edition 3. Jacob Millman, Christos C Halkias and Satyabrata G., “Millman’s Electronic Devices and Circuits”, Mc-Graw Hill, 3rd Edition 4. Muhammad H. Rashid, “Microelectronics Circuits Analysis and Design”, Cengage Learning, 2nd Edition 5. Anil K. Maini and Varsha Agrawal, “Electronic Devices and Circuits”, Wiley Publications Internal Assessment (IA) : Two tests must be conducted which should cover at least 80% of syllabus. The average marks of both the tests will be considered for final Internal Assessment. End Semester Examination: 1. Question paper will comprise of 6 questions, each carrying 20 marks. 2. The students need to solve total 4 questions. 3. Question No.1 will be compulsory and based on entire syllabus. 4. Remaining question (Q.2 to Q.6) will be selected from all the modules. |

Digital Electronics – Electronics & Telecommunication Engineering Semester 3 Syllabus |

Number Systems and Codes 04 1.1 Arithmetic codes: Review of number system, BCD code, Octal code, Hexadecimal code, EX-3 code, Gray code, ASCII Code 2.0 Logic Gates and Combinational Logic Circuits 16 2.1 DTL, TTL, ECL and CMOS gates: Transfer characteristics, noise margin, fan-in, fan-out, introduction to their logic families, their transfer characteristics and noise margin 2.2 Universal gates and combinational circuits: Realization of basic gates using NAND and NOR gates, Boolean algebra, De Morgan’s theorem, SOP and POS representation, K-map up to five variables, Quine-McClusky method, variable entered mapping 2.3 Arithmetic circuits: Adder, subtractor, carry look ahead adder, BCD adder, magnitude comparator, binary multiplier, series and parallel adder 2.4 Multiplexer and de-multiplexer: Boolean functions implementation using multiplexer and de-multiplexer, encoder and decoder, parity generator and checker 3.0 Sequential Logic Circuits 16 3.1 Flip flops and registers: RS, JK, T, D and master slave flip flops, conversion of flip flops, universal shift registers 3.2 Counter design: Asynchronous and synchronous counter, up/down counter, mod-N counter, pre-settable counter, skipping state counter 3.3 Shift registers design: SISO, SIPO, PISO, PIPO, shift left and shift right registers 3.4 Applications of sequential circuits: Frequency division, ring counter, Johnson counter, Moore and Mealy machine, state transition diagram, synthesis table 3.6 State reduction techniques: Row elimination and implication table methods 4.0 Different types of Memory 06 4.1 Classification and characteristics of memory: SRAM, DRAM, ROM, PROM, EPROM and FLASH memories 5.0 Introduction to Programmable Logic Devices 10 5.1 CPLD and FPGA: Architecture of CPLD and FPGA, Xilinx XC 9500 CPLD Series and Xilinx XC 4000 FPGA Series 5.2 VHDL: Data types, Structural Modeling using VHDL, attributes, data flow, behavioral, VHDL implementation of basic combinational and sequential Circuits 5.3 Programmable Logic Devices: PLA and PAL |

Text Books: 1. Morris Mano and Michael D. Ciletti, “Digital Design”, Pearson Education, Fourth Edition, 2008. 2. Malvino A.P. and Leach D.P., “Digital Principles and Applications”, TMH, 6th Edition Reference Books: 1. John F. Warkerly, “Digital Design Principles and Practices”, Person Education, Fourth Edition, 2008. . 2. J. Bhaskar, “VHDL Primer”, Prentice Hall, 3rd Edition 3. William I. Fletchter, “An Engineering Approach to Digital Design”, PHI, Tenth Indian Reprint, 2001. 4. Norman Balabanian and Bradley Carlson, “Digital Logic Design Principles”, John Wiley & Sons, First Edition, 2011. 5. A. Anand Kumar, “Fundamentals of Digital Circuits”, PHI, Second Edition, 2012. 6. Charles H. Roth, “Fundamentals of Logic Design”, Jaico Publishing House, First Edition, 2004. 7. G. K. Kharate, “Digital Electronics”, Oxford University Press, First Edition, 2010 8. R. P. Jain, “Modern Digital Electronics”, Tata McGraw Hill Education, Third Edition 2003. 9. Frank Vahid, “Digital Design”, John Willy and Sons, First Edition, 2011. Internal Assessment (IA): Two tests must be conducted which should cover at least 80% of syllabus. The average marks of both the tests will be considered for final Internal Assessment. End Semester Examination: 1. Question paper will comprise of 6 questions, each carrying 20 marks. 2. The students need to solve total 4 questions. 3: Question No.1 will be compulsory and based on entire syllabus. 4: Remaining question (Q.2 to Q.6) will be selected from all the modules. |

Circuits and Transmission Lines – Electronics & Telecommunication Engineering Semester 3 Syllabus |

Electrical circuit analysis 12 1.1 Analysis of DC circuits: Analysis of circuits with and without controlled sources using generalized loop and node matrix methods and Source Transformation, Superposition, Thevenin, Norton, Millman theorems 1.2 Magnetic circuits: Self and mutual inductances, coefficient of coupling, dot convention, equivalent circuit, solution using loop analysis 1.3 Tuned coupled Circuits: Analysis of tuned coupled circuits 2.0 Time and frequency domain analysis 10 2.1 Time domain analysis of R-L and R-C circuits: Forced and natural response, time constant, initial and final values Solution using first order equation for standard input signals: Transient and steady state time response, solution using universal formula 2.2 Time domain analysis of R-L-C Circuits: Forced and natural response, effect of damping Solution using second order equation for standard input signals: transient and steady state time response 2.3 Frequency domain analysis of RLC Circuits: S-domain representation, applications of Laplace Transform in solving electrical networks, driving point and transfer Function, Poles and Zeros, calculation of residues by analytical and graphical method, analysis of ladder and lattice network Response to standard signals: Transient and steady state time response of R-L-C circuits 3.0 Synthesis of RLC circuits 10 3.1 Positive real functions: Concept of positive real function, testing for Hurwitz polynomials, testing for necessary and sufficient conditions for positive real functions 3.2 Synthesis of RC, RL, LC and RLC circuits: Properties and synthesis of RC, RL, LC driving point functions 4.0 Two port circuits 10 4.1 Parameters: Open circuits, short circuit, transmission and hybrid parameters, relationship among parameters, reciprocity and symmetry conditions. 4.2 Interconnections of two-port circuits, T & ? representation. 4.3 Terminated two-port circuits. 5.0 Radio frequency transmission lines 10 5.1 Transmission Line Representation: T and ? representations, terminated transmission line, infinite line 5.2 Parameters of radio frequency lines: Propagation constant, attenuation constant, phase constant, group velocity, input impedance, characteristic impedance, reflection coefficient, standing wave ratio, VSWR, ISWR, Sparameters 5.3 Smith Chart: Impedance locus diagram, impedance matching |

Text Books 1. Franklin F Kuo, “Network Analysis and Synthesis”, Wiley Toppan, 2nd.ed. 1966 2. W L Everitt and G E Anner, “Communication Engineering”, Mc-GrawHill, New York, 3rd Edition, 1956 Reference Books 1. M E Van Valkenburg, “Network Analysis”, Prentice-Hall of India Pvt Ltd, New Delhi, 26th Indian Reprint, 2000 2. K V V Murty and M S Kamth, “Basic Circuit Analysis”, Jaico Publishing house, London 3. A Chakrabarti, “Circuit Theory”, Dhanpat Rai & Co., Delhi, 6h Edition Internal Assessment (IA): Two tests must be conducted which should cover at least 80% of syllabus. The average marks of both the test will be considered for final Internal Assessment. End Semester Examination: 1. Question paper will comprise of 6 questions, each carrying 20 marks. 2. The students need to solve total 4 questions. 3: Question No.1 will be compulsory and based on entire syllabus. 4: Remaining question (Q.2 to Q.6) will be selected from all the modules. |

Electronic Instruments and Measurements |

Principals of measurement 06 1.1 Introduction to basic instruments: Components of generalized measurement system, applications of instrument systems, static and dynamic characteristics of instruments, concepts of accuracy, precision, linearity, sensitivity, resolution, hysteresis, calibration 1,2 Errors in measurement: Errors in measurement, classification of errors, remedies to eliminate errors 2.0 Sensors and transducers 12 2.1 Basics of sensors and transducers: Active and passive transducers, characteristics and selection criteria of transducers, working principle of Eddycurrent sensors, Pizoelectric transducers, photoelectric and photo voltaic sensors, capacitive sensors 2.2 Displacement and pressure: Potentiometers, pressure gauges, Linear Variable Differential Transformers (LVDT) for measurement of pressure and displacement, strain gauges 2.3 Temperature transducers: Resistance Temperature Detectors (RTD), thermistors, and thermocouples, their ranges and applications 3.0 Testing and measuring Instruments 10 3.1 Analog multi-meter: Multi-range measurement of voltage, current and resistance, specifications 3.2 Measurement of resistance: Kellvin’s double bridge, Wheatstone bridge, and Megaohm bridge Measurement of inductance: Maxwell bridge and Hey bridge; Measurement of capacitance: Schering bridge Q-Meter: Operating principle and applications 3.3 Energy and power meters: Working of energy and power meter 4.0 Data Acquisition and Digital Instruments 10 4.1 Data acquisition and converters: single channel, multichannel and PC based DAS A/D and D/A converters: Types and specifications of A/D and D/A converters, Significance of X½ digit display 4.2 Digital multi-meter: Block diagram, multi range measurement of voltage, current and resistance, specifications 5.0 Oscilloscopes 08 5.1 Cathode ray oscilloscope: Block diagram based Study of CRO, specifications, controls, sweep modes, role of delay line, single- and dual-beam dual-trace CROs, chop and alternate modes 5.2 Measurement using oscilloscope: measurement of voltage, frequency, rise time, fall time and phase difference. Lissajous figures in detection of frequency and phase 5.3 Digital storage oscilloscope (DSO): Block diagram based study of DSO, study of features like roll, refresh, storage mode and sampling rate; applications of DSO 6.0 Signal analyzers 06 6.1 Wave analyzers: Introduction to harmonic, total harmonic distortion analyzer; block diagram and applications of wave analyzers 6.2 Spectrum and network analyzers: Block diagram and applications |

Text Books: 1. H. Oliver and J. M. Cage, “Electronic Measurement and Instrumentation”, McGraw Hill, 3rd edition, 2008 2. C. S. Rangan, G.R. Sarma, and V.S.V. Mani, “Instrumentation Devices and Systems”, Tata McGraw Hill, 9th edition, 2007 Reference Books: 1. T. S. Rathore, “Digital Measurement Techniques”, Narosa Publishing House, New Delhi, 2nd Edition, 2003 2. W. Cooper and A. Helfric, “Electronic Instrumentation and Measurement Techniques”, PHI, 4th edition, 2009 3. H. S. Kalsi, “Electronics Instrumentation”, Tata Mcgraw Hill, 2nd Edition, 2009 Internal Assessment (IA): Two tests must be conducted which should cover at least 80% of syllabus. The average marks of both the test will be considered for final Internal Assessment. End Semester Examination: 1. Question paper will comprise of 6 questions, each carrying 20 marks. 2. The students need to solve total 4 questions. 3: Question No.1 will be compulsory and based on entire syllabus. 4: Remaining question (Q.2 to Q.6) will be selected from all the modules. |

Object Oriented Programming Methodology |

Fundamental concepts of object oriented programming 4 1.1 Overview of programming 1.2 Introduction to the principles of object-oriented programming: classes, objects, messages, abstraction, encapsulation, inheritance, polymorphism, exception handling, and object-oriented containers 1.3 Differences and similarity between C++ and JAVA 2 Fundamental of Java programming 4 2.1 Features of Java 2.2 JDK Environment & tools 2.3 Structure of Java program 2.4 Keywords , data types, variables, operators, expressions 2.5 Decision making, looping, type casting 2.6 Input output using scanner class 3 Classes and objects 6 3.1 Creating classes and objects 3.2 Memory allocation for objects 3.3 Passing parameters to Methods 3.4 Returning parameters 3.5 Method overloading 3.6 Constructor and finalize ( ) 3.7 Arrays: Creating an array 3.8 Types of array : One dimensional arrays ,Two Dimensional array, string 4 Inheritance, interface and package 6 4.1 Types of inheritance: Single, multilevel, hierarchical 4.2 Method overriding, super keyword, final keyword, abstract class 4.3 Interface 4.4 Packages 5 Multithreading 4 5.1 Life cycle of thread 5.2 Methods 5.3 Priority in multithreading 6 Applet 2 6.1 Applet life cycle 6.2 Creating applet 6.3 Applet tag |

Text Books: 1. Rajkumar Buyya, “Object-oriented programming with JAVA”, Mcgraw Hill 2. E Balgurusamy, “Programming with JAVA”, Tata McGraw Hill Reference Books: 1. Herbert Schildt, “The Complete Reference JAVA”, Tata McGraw Hill 2. Barry Holmes and Daniel T. Joyce, “Object Oriented Programming with Java”, Jones & Bartlett Learning |